Abstract:
In the field of RF and microwave measurement measuring the S-parameter is a primary step to understand the nature of any network/device. During the recent years, many techniques or technology has been developed for it. The present device for this task is vector network analyzer (VNA) but unlike, many devices it also has limitations like complex in structure, bigger in size, expensive etc. These limitations can be overcome by using multiport reflectometer as a replacement of VNA for low cost application. This makes the multiport reflectometer an important asset in the field of RF and microwave measurement. In last four decades, there has been a rapid progress to make multiport reflectometer as an alternate option for VNA. This includes changing the design of multiport reflectometer, adopting new calibration method, changing design of the multiport reflectometer components, etc. The multiport reflectometer can be used at millimeter frequency range as its power requirement is less and a compact power source at these frequencies is tough to obtain. The work in this thesis provides a new design of six port reflectometer and a calibration method for estimating S11 of any device under test. A SPR at 2 GHz is designed, simulated and fabricated in frequency band from 1.9 GHz to 2.2 GHz and using the calibration method in order to validate that it can be used as a network analyzer for measuring S11 of the DUT.
Also, a dual SPNA is designed and simulated at 2 GHz in the frequency band from 1.9 GHz to 2.2 GHz. This designed dual SPNA is using the earlier designed SPR and a SPN network. Also, it is using the different calibration method to validate such that, it can be used as a network analyzer for measuring S21 of the DUT
