Abstract:
The work presented in this thesis is based on nano-structured oxide thin films. In the
first chapter a pertinent description of thin film is given. PLD technique is used for film
fabrication. X-Ray diffractometer, FESEM-EDAX and Premier 11 (Radiant Technology) is
used to characterise the thin films, a succinct description of all the instruments is given in
introductory chapter. BFO (BiFe03) and BTO (Bi.T6012) materials are chosen for thin film
- fabrication. BiFe03 and BTO's, bulk and thin film preparation and all the characterization are
given in chapter 2 and chapter 3 respectively. Experimental and theoretical results are
discussed in both the chapters. Chapter 4 includes the application part of oxide thin films,
MRAM technology is described and a firm comparison of MRAM with other technologies of
computer memories is given. Finally a conclusion of complete work is given in the last. To
develop an understanding of the work, a number of review papers, research papers, books and
Internet sources are referred; a complete list of references is given at the last of thesis.
