Abstract:
Recent years the radiation effects on modern electronic devices are considered to be an
important task, due to continues technology scaling and minimal nodal capacitances. Heavy ion
impacts on electronic devices causes the large amount of electron-hole pair generation along it's
track. The generated charge under the established electric fields would create the electrical
disruptions and changes in node voltages. This became worse for the current technologies due to
reduced feature sizes and supply voltages. In this report, we present radiation particle
interactions, effects on FinFET SRAM cell. The main objective of this report is to benchmark the
FinFET to get the required performance followed by 3-dimensional numerical simulation of 6TSRAM
cell as a contiguous block of silicon and to study the impact of heavy ions on the data
states of the cell. We studied the critical charge (Qcrt) characterization of the designed SRAM
cell and found the SEU threshold Linear Energy Transfer (LET).
