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http://localhost:8081/xmlui/handle/123456789/9862
Title: | EFFECT ON FAULT DETECTION CAPABILITY OF TEST SUITES DUE TO MINIMIZATION |
Authors: | Seshidhar, I. Maruthi |
Keywords: | ELECTRONICS AND COMPUTER ENGINEERING;EFFECT-FAULT DETECTION;CAPABILITY-TEST SUITES;MS VC++ |
Issue Date: | 2004 |
Abstract: | Test-suite minimization techniques attempt to reduce the time of tests, by eliminating redundant test cases from test-suites. A potential drawback of these techniques is that in minimizing a test-suite, the ability of that test-suite to reveal faults in the software might be reduced. This thesis presents a new test-suite minimization algorithm for single-entity criteria, which can be used for minimizing test suites of software written in languages that allow short-circuiting in evaluating conditional expressions. The algorithm presented in this thesis uses heuristics to minimize test-suites. These heuristics give an approximate solution to optimal test-suite minimization problem. The results show that good minimization in test-suite size can be achieved without sacrificing much fault detection capability. The proposed algorithm is implemented using MS VC+ + using MFC on Windows XP Professional The testing is done using VectorCASTIC. |
URI: | http://hdl.handle.net/123456789/9862 |
Other Identifiers: | M.Tech |
Research Supervisor/ Guide: | Kumar, Padam |
metadata.dc.type: | M.Tech Dessertation |
Appears in Collections: | MASTERS' THESES (E & C) |
Files in This Item:
File | Description | Size | Format | |
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ECDG11889.pdf | 3.46 MB | Adobe PDF | View/Open |
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