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dc.contributor.authorSeshidhar, I. Maruthi-
dc.date.accessioned2014-11-20T12:45:31Z-
dc.date.available2014-11-20T12:45:31Z-
dc.date.issued2004-
dc.identifierM.Techen_US
dc.identifier.urihttp://hdl.handle.net/123456789/9862-
dc.guideKumar, Padam-
dc.description.abstractTest-suite minimization techniques attempt to reduce the time of tests, by eliminating redundant test cases from test-suites. A potential drawback of these techniques is that in minimizing a test-suite, the ability of that test-suite to reveal faults in the software might be reduced. This thesis presents a new test-suite minimization algorithm for single-entity criteria, which can be used for minimizing test suites of software written in languages that allow short-circuiting in evaluating conditional expressions. The algorithm presented in this thesis uses heuristics to minimize test-suites. These heuristics give an approximate solution to optimal test-suite minimization problem. The results show that good minimization in test-suite size can be achieved without sacrificing much fault detection capability. The proposed algorithm is implemented using MS VC+ + using MFC on Windows XP Professional The testing is done using VectorCASTIC.en_US
dc.language.isoenen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.subjectEFFECT-FAULT DETECTIONen_US
dc.subjectCAPABILITY-TEST SUITESen_US
dc.subjectMS VC++en_US
dc.titleEFFECT ON FAULT DETECTION CAPABILITY OF TEST SUITES DUE TO MINIMIZATIONen_US
dc.typeM.Tech Dessertationen_US
dc.accession.numberG11889en_US
Appears in Collections:MASTERS' THESES (E & C)

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