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DC Field | Value | Language |
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dc.contributor.author | Seshidhar, I. Maruthi | - |
dc.date.accessioned | 2014-11-20T12:45:31Z | - |
dc.date.available | 2014-11-20T12:45:31Z | - |
dc.date.issued | 2004 | - |
dc.identifier | M.Tech | en_US |
dc.identifier.uri | http://hdl.handle.net/123456789/9862 | - |
dc.guide | Kumar, Padam | - |
dc.description.abstract | Test-suite minimization techniques attempt to reduce the time of tests, by eliminating redundant test cases from test-suites. A potential drawback of these techniques is that in minimizing a test-suite, the ability of that test-suite to reveal faults in the software might be reduced. This thesis presents a new test-suite minimization algorithm for single-entity criteria, which can be used for minimizing test suites of software written in languages that allow short-circuiting in evaluating conditional expressions. The algorithm presented in this thesis uses heuristics to minimize test-suites. These heuristics give an approximate solution to optimal test-suite minimization problem. The results show that good minimization in test-suite size can be achieved without sacrificing much fault detection capability. The proposed algorithm is implemented using MS VC+ + using MFC on Windows XP Professional The testing is done using VectorCASTIC. | en_US |
dc.language.iso | en | en_US |
dc.subject | ELECTRONICS AND COMPUTER ENGINEERING | en_US |
dc.subject | EFFECT-FAULT DETECTION | en_US |
dc.subject | CAPABILITY-TEST SUITES | en_US |
dc.subject | MS VC++ | en_US |
dc.title | EFFECT ON FAULT DETECTION CAPABILITY OF TEST SUITES DUE TO MINIMIZATION | en_US |
dc.type | M.Tech Dessertation | en_US |
dc.accession.number | G11889 | en_US |
Appears in Collections: | MASTERS' THESES (E & C) |
Files in This Item:
File | Description | Size | Format | |
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ECDG11889.pdf | 3.46 MB | Adobe PDF | View/Open |
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