Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/9862
Title: EFFECT ON FAULT DETECTION CAPABILITY OF TEST SUITES DUE TO MINIMIZATION
Authors: Seshidhar, I. Maruthi
Keywords: ELECTRONICS AND COMPUTER ENGINEERING;EFFECT-FAULT DETECTION;CAPABILITY-TEST SUITES;MS VC++
Issue Date: 2004
Abstract: Test-suite minimization techniques attempt to reduce the time of tests, by eliminating redundant test cases from test-suites. A potential drawback of these techniques is that in minimizing a test-suite, the ability of that test-suite to reveal faults in the software might be reduced. This thesis presents a new test-suite minimization algorithm for single-entity criteria, which can be used for minimizing test suites of software written in languages that allow short-circuiting in evaluating conditional expressions. The algorithm presented in this thesis uses heuristics to minimize test-suites. These heuristics give an approximate solution to optimal test-suite minimization problem. The results show that good minimization in test-suite size can be achieved without sacrificing much fault detection capability. The proposed algorithm is implemented using MS VC+ + using MFC on Windows XP Professional The testing is done using VectorCASTIC.
URI: http://hdl.handle.net/123456789/9862
Other Identifiers: M.Tech
Research Supervisor/ Guide: Kumar, Padam
metadata.dc.type: M.Tech Dessertation
Appears in Collections:MASTERS' DISSERTATIONS (E & C)

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