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dc.contributor.authorSharma, Suman-
dc.date.accessioned2014-11-19T07:28:45Z-
dc.date.available2014-11-19T07:28:45Z-
dc.date.issued1993-
dc.identifierM.Techen_US
dc.identifier.urihttp://hdl.handle.net/123456789/9337-
dc.guideGupta, S. C.-
dc.description.abstractTwo approaches are given for the measurement of complex permittivity and permeability of materials in the X-band frequency. In the first approach, Complex permittivity and permeability have been calculated in terms of scattering parameters. In the second approach, complex permittivity and permeability have been calculated in terms of reflection coefficients for parallel and perpendicular polarizations for oblique incident angle. The reflection coefficients were obtained by using free-space technique. The absorption loss of microwave absorber as a function of frequency are also plotted. Interfacing of the network analyzer with the PC has been done using IEEE-488 interfacing card.en_US
dc.language.isoenen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.subjectCOMPLEX PERMITTIVITYen_US
dc.subjectIEEE-488en_US
dc.subjectX-BAND FREQUENCYen_US
dc.titleON--LINE MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY OF MATERIALSen_US
dc.typeM.Tech Dessertationen_US
dc.accession.number245819en_US
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