Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/9337
Title: ON--LINE MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY OF MATERIALS
Authors: Sharma, Suman
Keywords: ELECTRONICS AND COMPUTER ENGINEERING;COMPLEX PERMITTIVITY;IEEE-488;X-BAND FREQUENCY
Issue Date: 1993
Abstract: Two approaches are given for the measurement of complex permittivity and permeability of materials in the X-band frequency. In the first approach, Complex permittivity and permeability have been calculated in terms of scattering parameters. In the second approach, complex permittivity and permeability have been calculated in terms of reflection coefficients for parallel and perpendicular polarizations for oblique incident angle. The reflection coefficients were obtained by using free-space technique. The absorption loss of microwave absorber as a function of frequency are also plotted. Interfacing of the network analyzer with the PC has been done using IEEE-488 interfacing card.
URI: http://hdl.handle.net/123456789/9337
Other Identifiers: M.Tech
Research Supervisor/ Guide: Gupta, S. C.
metadata.dc.type: M.Tech Dessertation
Appears in Collections:MASTERS' THESES (E & C)

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