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Title: | ON--LINE MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY OF MATERIALS |
Authors: | Sharma, Suman |
Keywords: | ELECTRONICS AND COMPUTER ENGINEERING;COMPLEX PERMITTIVITY;IEEE-488;X-BAND FREQUENCY |
Issue Date: | 1993 |
Abstract: | Two approaches are given for the measurement of complex permittivity and permeability of materials in the X-band frequency. In the first approach, Complex permittivity and permeability have been calculated in terms of scattering parameters. In the second approach, complex permittivity and permeability have been calculated in terms of reflection coefficients for parallel and perpendicular polarizations for oblique incident angle. The reflection coefficients were obtained by using free-space technique. The absorption loss of microwave absorber as a function of frequency are also plotted. Interfacing of the network analyzer with the PC has been done using IEEE-488 interfacing card. |
URI: | http://hdl.handle.net/123456789/9337 |
Other Identifiers: | M.Tech |
Research Supervisor/ Guide: | Gupta, S. C. |
metadata.dc.type: | M.Tech Dessertation |
Appears in Collections: | MASTERS' THESES (E & C) |
Files in This Item:
File | Description | Size | Format | |
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ECD245819.pdf | 4.06 MB | Adobe PDF | View/Open |
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