Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/9238
Full metadata record
DC FieldValueLanguage
dc.contributor.authorNamita-
dc.date.accessioned2014-11-19T05:20:04Z-
dc.date.available2014-11-19T05:20:04Z-
dc.date.issued1994-
dc.identifierM.Techen_US
dc.identifier.urihttp://hdl.handle.net/123456789/9238-
dc.guideSarkar, S.-
dc.description.abstractGraceful degradation performance in multiple-device oscillator is experimentaly studied. Results show that power combining efficiency degradation takes place. Post failure load optimization leads to improvement in GD. Power combining efficiency and individual diode performance can be directly determined from GD-data, thereby eliminating the use of a single-diode oscillator.en_US
dc.language.isoenen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.subjectMULTIPLE-DEVICE OSCILLATOR GRACEFUL DEGRADATION PERFORMANCEen_US
dc.subjectGD DATAen_US
dc.subjectPOWER COMBINING EFFICIENCYen_US
dc.titleAN EXPERIMENTAL STUDY OF MULTIPLE-DEVICE OSCILLATOR GRACEFUL DEGRADATION PERFORMANCEen_US
dc.typeM.Tech Dessertationen_US
dc.accession.number246534en_US
Appears in Collections:MASTERS' THESES (E & C)

Files in This Item:
File Description SizeFormat 
ECD246534.pdf1.97 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.