Please use this identifier to cite or link to this item: http://localhost:8081/jspui/handle/123456789/9150
Full metadata record
DC FieldValueLanguage
dc.contributor.authorAgarwal, Rakesh Mohan-
dc.date.accessioned2014-11-18T09:57:30Z-
dc.date.available2014-11-18T09:57:30Z-
dc.date.issued1988-
dc.identifierM.Techen_US
dc.identifier.urihttp://hdl.handle.net/123456789/9150-
dc.guideSarkar, S.-
dc.description.abstractWith the advent of LSI and VLSI, the semiconductor devices have undergone an un-Precexlented miniaturizatLon.• In order to retain the basic device characteristics of the unsealed device, several scaling theories' ave been pro-posed and implemented. In this dissertation, the influence of device scaling on the frequency dependence of the trans-conductance of a MOSFET has been studied. Starting with the basic expression for MOS Trans conductance, various factors affecting it have been identified. From the study of the scaling dependence of these factors, the effect of scaling on the device transconductance is analysed. It is found that inorder to have a scaled MOSFET of high trans,-conductance with a flat frequency-transconductance curve,, some amount of voltage scaling along with dimensional scaling is desirable,en_US
dc.language.isoenen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.subjectELECTRONICS AND COMPUTER ENGINEERINGen_US
dc.titleFREQUENCY DEPENDENCE OF SCALED MOSFET-TRANSCONDUCTANCEen_US
dc.typeM.Tech Dessertationen_US
dc.accession.number179645en_US
Appears in Collections:MASTERS' THESES (E & C)

Files in This Item:
File Description SizeFormat 
ECD179645.pdf2.22 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.