Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/9150
Title: FREQUENCY DEPENDENCE OF SCALED MOSFET-TRANSCONDUCTANCE
Authors: Agarwal, Rakesh Mohan
Keywords: ELECTRONICS AND COMPUTER ENGINEERING;ELECTRONICS AND COMPUTER ENGINEERING;ELECTRONICS AND COMPUTER ENGINEERING;ELECTRONICS AND COMPUTER ENGINEERING
Issue Date: 1988
Abstract: With the advent of LSI and VLSI, the semiconductor devices have undergone an un-Precexlented miniaturizatLon.• In order to retain the basic device characteristics of the unsealed device, several scaling theories' ave been pro-posed and implemented. In this dissertation, the influence of device scaling on the frequency dependence of the trans-conductance of a MOSFET has been studied. Starting with the basic expression for MOS Trans conductance, various factors affecting it have been identified. From the study of the scaling dependence of these factors, the effect of scaling on the device transconductance is analysed. It is found that inorder to have a scaled MOSFET of high trans,-conductance with a flat frequency-transconductance curve,, some amount of voltage scaling along with dimensional scaling is desirable,
URI: http://hdl.handle.net/123456789/9150
Other Identifiers: M.Tech
Research Supervisor/ Guide: Sarkar, S.
metadata.dc.type: M.Tech Dessertation
Appears in Collections:MASTERS' THESES (E & C)

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