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| Issue Date | Title | Author(s) | Research Supervisor/ Guide | Type |
|---|---|---|---|---|
| 2013 | 3®DIMENSIONAL SIMULATION OF SINGLE EVENT UPSET OF 6T-SOI BASED 24 nm —FINFET -SRAM CELL | Jayaram, Namani | Dasgupta, Sudeb; Bulusu, Anand | M.Tech Dessertation |
| 2012 | MEMORY TESTING SCHEME FOR FinFET BASED SRAM CELL | Prasad, K. Durga | Dasgupta, Sudeb; Kaushik, B. K. | M.Tech Dessertation |
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