Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/3951
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dc.contributor.authorSharma, Shweta-
dc.date.accessioned2014-10-05T07:23:59Z-
dc.date.available2014-10-05T07:23:59Z-
dc.date.issued2004-
dc.identifierM.Techen_US
dc.identifier.urihttp://hdl.handle.net/123456789/3951-
dc.guideSarkar, S.-
dc.guideTondon, V. K.-
dc.description.abstractIn the present work, an improved analytical model for current-voltage relationship for DGMOSFET is developed by taking into account the effects ofMulti-subband occupancy and Drain Induced Barrier Lowering (DIBL). The current-voltage characteristics obtained by the use of this model are compared with experimental and simulation results reported in literature. The effects of backscattering on current-volatge characteristics are also studied.en_US
dc.language.isoenen_US
dc.subjectPHYSICSen_US
dc.subjectMOSFETen_US
dc.subjectDOUBLE GATEen_US
dc.subjectDGMOSFETen_US
dc.titleAN ANALYTICAL STUDY OE DOUBLE--GATE MOSFETen_US
dc.typeM.Tech Dessertationen_US
dc.accession.numberG11799en_US
Appears in Collections:MASTERS' THESES (Physics)

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