Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/3172
Title: RELIABILITY IMPROVEMENT OF ELECTRONICS MODULE BY DERATING
Authors: Tripathi, Harikesh
Keywords: ELECTRICAL ENGINEERING;ELECTRONICS MODULE;DERATING;OPTIMIZATION TECHNIQUES
Issue Date: 2012
Abstract: Derating is the technique for limiting the stresses (Electrical, Thermal, Mechanical and Radiation) acting on the different parts of the circuit. By limiting the stresses on the each parts of the circuit, the probability of the occurrence of the failure will be lessened and it will lead to increase in the circuit reliability. Derating is the better technique for improving the reliability than the other technique such as the redundancy allocation technique, by which we can also increase the reliability but at the cost of the increase in complexity, weight and volume, while by derating we can achieve the targeted reliability without increasing the complexity of the circuit. In my dissertation report I have done a proper components selection to replace the components of the circuit by higher rating components in minimum cost. Here I have applied the concept of the derating in the practical full bridge converter circuit and . achieve the targeted reliability in minimum cost by using the optimization technique genetic, dynamic programming and hybrid optimization technique, and made a comparison among the optimization technique, (genetic algorithm, dynamic programming and hybrid optimization method) and saw which is working more efficiently.
URI: http://hdl.handle.net/123456789/3172
Other Identifiers: M.Tech
Research Supervisor/ Guide: Gupta, H. O.
Agarwal, Pramod
metadata.dc.type: M.Tech Dessertation
Appears in Collections:MASTERS' DISSERTATIONS (Electrical Engg)

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