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dc.contributor.authorKumar, Arvind-
dc.date.accessioned2025-08-01T07:11:25Z-
dc.date.available2025-08-01T07:11:25Z-
dc.date.issued2014-06-
dc.identifier.urihttp://localhost:8081/jspui/handle/123456789/18015-
dc.description.abstractMultiferroic materials exhibits magnetoelectric coupling between magnetic and ferroelectric phase ordering. In the present work, the La and Mn co-doped BiFe03 (BFO) nanostructured thin films with various thicknesses were deposited on LaNi03 (LNO) coated Si substrate by pulsed laser deposition technique (PLD). The structural, electrical, and optical properties of BLFMOILNO/Si heterostructure thin films were systematically investigated. The asdeposited BLFMO thin films were characterized by X-ray diffraction (XRD), Field emission scanning electron microscopy (FE-SEM), Energy dispersive spectroscopy analysis (EDS), impedance analyzer, atomic force microscopy (AFM), and ferroelectric tester. The doping effect at A,B-site have been evaluated and found the improvement in the multiferroic properties of BLFMO thin films. Therefore, Variation in the thickness from 100 to 830nm had a significant impact on the properties of BLFMO thin films.en_US
dc.description.sponsorshipINDIAN INSTITUTE OF TECHNOLOGY ROORKEEen_US
dc.language.isoenen_US
dc.publisherIIT ROORKEEen_US
dc.subjectMultiferroic Materialsen_US
dc.subjectMagnetoelectric Couplingen_US
dc.subjectNanostructured Thin Filmsen_US
dc.subjectX-Ray Diffraction (XRD)en_US
dc.titleSTUDY OF STRUCTURAL, ELECTRICAL AND OPTICAL PROPERTIES OF Bi0.9La0.1Fe0.5Mn0.503 (BLFMO) NANOSTRUCTURED THIN FILMen_US
dc.typeOtheren_US
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