Please use this identifier to cite or link to this item: http://localhost:8081/jspui/handle/123456789/16914
Title: ANALYTICAL MODELLING AND SIMULATION OF MULTI- GATE SILICON NANOWIRE FET FEATURING AMBIPOLARITY AND DUAL-THRESHOLD VOLTAGE CHARACTERISTICS
Authors: Dutta, Ayan
Keywords: MOSFETs In Standard;CMOS Technology;Quantum Mechanics;Transistor Architectures
Issue Date: May-2015
Publisher: IIT ROORKEE
Abstract: Downscaling of conventional MOSFETs in standard CMOS technology is becoming much tougher each day , since in nanoscale devices, quantum mechanics comes into effect & off-state leakage * increases drastically. In order to counter these obstacles , various transistor architectures like FinFET Silicon Nanowire FET etc have been invented. In this article , a novel idea for analytical modelling of Tn-Gate Silicon Nanowire FET structure has been proposed. This device is conceptualized to show ambipolarity & Dual-Threshold Voltage features , i.e. this uncommitted device can be operated as a pFET or nFET with high or low threshold voltage at the runtime , by electrically tuning its polarity gates
URI: http://localhost:8081/jspui/handle/123456789/16914
metadata.dc.type: Other
Appears in Collections:MASTERS' THESES (E & C)

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