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http://localhost:8081/jspui/handle/123456789/16914
Title: | ANALYTICAL MODELLING AND SIMULATION OF MULTI- GATE SILICON NANOWIRE FET FEATURING AMBIPOLARITY AND DUAL-THRESHOLD VOLTAGE CHARACTERISTICS |
Authors: | Dutta, Ayan |
Keywords: | MOSFETs In Standard;CMOS Technology;Quantum Mechanics;Transistor Architectures |
Issue Date: | May-2015 |
Publisher: | IIT ROORKEE |
Abstract: | Downscaling of conventional MOSFETs in standard CMOS technology is becoming much tougher each day , since in nanoscale devices, quantum mechanics comes into effect & off-state leakage * increases drastically. In order to counter these obstacles , various transistor architectures like FinFET Silicon Nanowire FET etc have been invented. In this article , a novel idea for analytical modelling of Tn-Gate Silicon Nanowire FET structure has been proposed. This device is conceptualized to show ambipolarity & Dual-Threshold Voltage features , i.e. this uncommitted device can be operated as a pFET or nFET with high or low threshold voltage at the runtime , by electrically tuning its polarity gates |
URI: | http://localhost:8081/jspui/handle/123456789/16914 |
metadata.dc.type: | Other |
Appears in Collections: | MASTERS' THESES (E & C) |
Files in This Item:
File | Description | Size | Format | |
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G25143.pdf | 3.84 MB | Adobe PDF | View/Open |
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