Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/12238
Title: REDUNDANCY OF COMPONENTS IN SEMICONDUCTOR CIRCUITS FOR PROTECTIVE RELAYING
Authors: Kumar, Sunil
Keywords: ELECTRICAL ENGINEERING;SEMICONDUCTOR CIRCUITS;PROTECTIVE RELAYING;POWER SYSTEM
Issue Date: 1971
Abstract: In the last few yea the subjct reliability has become of prime importance, because the sytm Complexity Is Inc easing day by' day, with Technological advoncomer4t specially in the space technology, reliability is playing a major *ole as each element or, System of 'the space sp has to tork satisfactorllV during Its operative life for succes-0 ful operation. In terms of money the cost of failure to euccessM operation may 'be quit' high, Generally, the cost of un,oUabtlity Is not the only cost of failed item, but of the asoociated equipment as well which is' damaged as result of failure • Ms is duo to 'the Interdependency between cOporiont5 in a complex sytei, For a power syotonn on4neer, the reliability of a protective schoe is of equal imrotance since the failure of such a scheme# whose prime function is of protecting the other equipment under abtoxmal conditions may cause a heavy loss of money* time and some times human life also. In the pront rk the author has developed a rEii&blo coincidence citculti, cith the help of redundancy, In tho first Chptor the basic Concepts of reliability, diffornt types of failures that are Co have been d&sø cussed including a fes ruler, which should be obsørved while designing a reliable circuit,
URI: http://hdl.handle.net/123456789/12238
Other Identifiers: M.Tech
Research Supervisor/ Guide: Gupta, S. C.
Rao, T. S. M.
metadata.dc.type: M.Tech Dessertation
Appears in Collections:MASTERS' THESES (Electrical Engg)

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