Please use this identifier to cite or link to this item: http://localhost:8081/xmlui/handle/123456789/10158
Title: CHARACTERIZATION OF MICROWAVE ABSORBERS AT OBLIQUE INCIDENCE
Authors: Mohan, P. Rama
Keywords: ELECTRONICS AND COMPUTER ENGINEERING;MICROWAVE ABSORBERS;OBLIQUE INCIDENCE;METAL SHEET
Issue Date: 1991
Abstract: An extension toward generalization including cases of oblique incidence angles is attempted. A more general model has been developed for linear plane polarization, which determines the refl ect.i on Coefficient. of a mul ti. layer absorber on a metal sheet. as either a function of frequency for a specified angle of incidence or as a function of incidence angle for a specified frequency. The absorption characteristics of two sheets were studied as a function of incident angle by measuring the reflect-ion coefficients for parallel and perpendicular polarizations. For both sheets, these reflection coefficients were obtained by using free-space bi st.a t.i c calibration technique and plotted the 'absorption characteristics as function of frequency for each incident. angle.
URI: http://hdl.handle.net/123456789/10158
Other Identifiers: M.Tech
Research Supervisor/ Guide: Gupta, S. C.
metadata.dc.type: M.Tech Dessertation
Appears in Collections:MASTERS' DISSERTATIONS (E & C)

Files in This Item:
File Description SizeFormat 
ECD246080.pdf2.21 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.